PHASE LINEAR 700 700B SERIES I OUTPUT TRANSISTOR SET
Item History & Price
| Reference Number: Avaluer:29711053 | Amplifier+Type: Power+Amplifiers |
| Brand: PHASE LINEAR,OTHERS | Country/Region of Manufacture: United States |
| Amplifier Type: Power Amplifiers | Type: Semiconductors |
PHASE LINEAR 700 / 700B SERIES I COMPLETE OUTPUT TRANSISTOR SET. THESE OUTPUT TRANSISTORS ARE MATCHED TO FIT THE PHASE LINEAR SERIES I 700 OR 700B POWER AMPLIFIER. THESE DIRECT REPLACEMENT ON SEMICONDUCTOR DEVICES ARE RATED AT 250 VOLTS 16AMPS 250WATTS. (According to ON, they have the largest die of any TO-3 power transistor on the market which means they can dissipate more heat and operate more reliably. YOU WILL RECEIVE (20) HFE MATCHED NPN OUTP...UT TRANSISTORS AND (4) HFE MATCHED NPN OUTPUT DRIVER TRANSISTORS. (ENOUGH TO UPGRADE OR REPAIR BOTH CHANNELS OF THE PL-700 SERIES I AMPLIFIER) FULLY TESTED . YOU WILL ALSO RECEIVE (1) COMPLETE SERVICE MANUAL IN HIGH RESOLUTION PDF FORMAT, (24) NEW MICA INSULATORS AND 3.0 GRAMS OF PURE WHITE SILICONE THERMAL GREASE. AS ALWAYS, THANKS FOR LOOKING.NOTE: DON'T FORGET TO CHECK BIAS AND OFFSET AFTER INSTALLATION. FeaturesPerforated Emitter technology specifically designed for high power audio output, disk headpositioners and linear applications.• Total Harmonic Distortion Characterized• High DC Current Gain − hFE = 25 Min @ IC = 8 Adc• Excellent Gain Linearity• High SOA: 3 A, 80 V, 1 SecMAXIMUM RATINGSRating Symbol Value UnitCollector−Emitter Voltage VCEO 250 VdcCollector−Base Voltage VCBO 400 VdcEmitter−Base Voltage VEBO 5 VdcCollector−Emitter Voltage − 1.5V VCEX 400 VdcCollector Current − ContinuousIC 1630AdcBase Current − Continuous IB 5 AdcTotal Device Dissipation @ TC = 25CDerate above 25CPD 2501.43WW/COperating and Storage JunctionTemperature RangeTJ, Tstg −65 to +200 CTHERMAL CHARACTERISTICSCharacteristics Symbol Max UnitThermal Resistance, Junction−to−Case RJC 0.7 C/WMaximum ratings are those values beyond which device damage can occur.Maximum ratings applied to the device are individual stress limit values (notnormal operating conditions) and are not valid simultaneously. If these limits areexceeded, device functional operation is not implied, damage may occur andreliability may be affected.
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